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Products
  • Egypt Technology System
    Barcode printers
    Hand Held Barcode Scanner Scan Pattern: Single scan line Scan Speed: 100 scan lines/sec Interfaces: USB Keyboard Wedge Reads: 1D (Standard) & GS1 DataBar Drop: 1.5 m (5 ́) drops IP: IP31
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  • Egypt Technology System
    Barcode Readers

    Hand Held Barcode Scanner

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  • Egypt Technology System
    Portable printers
    Hand Held Barcode Scanner Scan Pattern: Liner Imager Scan Speed: 270 scan lines/sec Interfaces: USB Keyboard Wedge Reads: 1D (Standard)
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  • Egypt Technology System
    ID card Printers
    Hand Held Barcode Scanner Scan Pattern: Liner Imager Scan Speed: 200 scan lines/sec Interfaces: USB Keyboard Wedge Reads: 1D (Standard)
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  • Egypt Technology System
    Receipt printers
    Scan Pattern: Omni directional Scan Speed: 1800 scan lines/sec Interfaces: USB Keyboard Wedge Reads: 1D (Standard)
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  • Egypt Technology System
    Cameras

    The Electron Microscope Unit at Nanotechnology & advanced material central lab aims to introduce a high level service in microscopic techniques for researchers and students interested in exploring the invisible nano life.

    This unit includes TECNAI G20 S-Twin high resolution electron microscope unit (HRTEM) covering the full range of imaging and microanalysis techniques.

    The instrument specification:

    > Operation voltage up to 200 kV.

    > Magnification up to 1.013 Million.

    > Camera magnification up to 10 Mx.

    > Ultra high resolution: point-point 1 nm.

    > Lattice resolution 0.144 nm .

    > Electron beam diffraction.

    > Digital image recording.

    > Size measurement over the Digital image.

    > Camera type : Eagle camera 200 kV.

    > High brightness electron source LaB6.

      Renal biopsy             Tungsten Oxide Nano sheets

    Renal biopsy                       Tungsten Oxide Nano sheets

      Graphitized Carbon             Gold Nano Particle

    Graphitized Carbon                  Gold Nano Particle

     Additional Specification:

    > Specimen holder is double tilt in ( α & β ) direction, which gives the ability to be sure that the particle is two dimension or three

    dimension.

    Illustration:-

     > α-tilting nearly up to ± 45 degree.

    > β-tilting nearly up to ± 29 degree.

     

    Electron beam diffraction:

    * Giving pattern which is interesting to consider three types of solid matter: single crystals, polycrystals and amorphous materials.

    Diffraction pattern for Single crystalline material                                                             Diffraction pattern for polycrystalline material

    Diffraction pattern for Single crystalline material          Diffraction pattern for polycrystalline material

    Dark Field (DF):

    > Dark field image to show the atoms which diffract the electron beam with same angle. The glowing particles in the DF image indicate to the atoms which diffract the electron beam to give the third ring in the diffraction pattern .

    Scanning Transmission Electron Microscope unit (STEM):

    > Magnification up to 10 Mx.

    > Resolution 1 nm.

    > Supporting for EDX unit in Mapping, Line and point analysis.

    EDX (Energy Dispersive X-rays).

    > Making semi quantitative analysis.

    > Mapping, Point and Line analysis are available.

           

    Element

    Weight % Atomic %
    ----------- ----------- -----------

    Al(K)

    12.83 25.74

    Fe(K)

    0.18  0.18

    Cu(K)

    86.97  74.07

    Microscope booking request

    Researchers wishing to evaluate their samples kindly complete the Electron Microscopy Booking Request Form and wait for the unit senior confirmation.

     

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  • Egypt Technology System
    Time attendance
    X-ray diffraction (XRD) is a versatile, non-destructive technique that reveals detailed information about the chemical composition and crystallographic structure of natural and manufactured materials. The unit includes X’ Pert PRO Panalytical X-ray diffraction. The instrument specifications > High Speed , High Quality Phase > Identification and Quantification of Poly- > Crystalline Materials. > Theta – Theta Goniometer means that the Sample always Stay Horizontal so Loose Samples will not fall. > Analyzing Traces Samples in Special Holders or in Capillary Tubes. > Resolution 0.001°. The sample stage specification: > Non –Spinning Sample Stage. > Reflection – Transmission Spinner Stage. > Capillary Spinner Stage for Powders and Liquids for Preferred Orientation with the changing the Spinning Speed. Transmission Measurements > Materials consisting of light atoms, such as organic compounds from the polymer or pharmaceutical industries, are 'transparent' for X-rays and also Spinning of the samples brings more crystallites into the diffraction condition. In these cases transmission experiments are advised. Hardware Configuration for Transmission and SAXS Measurements Rietveld refinement Analysis > Quantitative phase analysis > Determination of the amorphous content > Crystallinity determination > Crystallite size/micro strain analysis. X-Ray booking request Researchers wishing to evaluate their samples kindly complete the X-Ray Diffraction Booking Request Form and wait for the unit senior confirmation.
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